Abstract
A simple experiment set up to measure the spectral values of u is described. It is shown th is described. It is shown that the monitoring of ; values offers an adv values offers an advantage over the conventional monitoring of R or T values in control and monitoring of transparent optical films on transparent substrates. A method is proposed to derive the optical constants of the transparent films (refractive index and thickness of the film simultaneously) from the measured ; values in the region values in the region of transparency.
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