Thickness dependent transport and magnetotransport in CSD grown La 0.7Pb 0.3MnO 3 manganite films

Abstract

We report the effect of film thickness on transport and magnetotransport in La 0.7Pb 0.3MnO 3 (LPMO) manganite films grown on single crystalline LaAlO 3 substrate using chemical solution deposition (CSD) technique. AFM measurements show the island type grain growth responsible for the strain at the film–substrate interface, while structural studies using XRD shows the presence of thickness dependent compressive strain in the films which modifies the transport and magnetotransport in LPMO/LAO films. The observation of low temperature resistivity minima behavior in all the LPMO films has been explained in the context of electron–electron scattering mechanism. The ZFC–FC magnetization measurements show the glassy state behavior below T min.