Abstract
This paper presents structural, magnetic, and transport properties measurements carried out on Co thin film as a function of thickness. The structure of the Co thin film changes from amorphous to nano-crystalline with the increase in film thickness. The corresponding magnetic and transport measurements show drastic changes in coercivity, saturation field and resistivity value as a function of Co film thickness. Observed magnetization and resistivity behaviour is mainly attributed to the (i) Change in crystal structure, (ii) stress relaxation, (iii) grain growth as revealed by X-ray diffraction (XRD), and atomic force microscopy (AFM) measurements.
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