Abstract
BiFeO 3 films of different thicknesses were grown on the LaNiO3-buffered Si (100) substrate via a sol-gel spin-coating processing. X-ray diffraction and Raman spectra studies revealed a thickness dependent structural and strain state evolution. The thickness dependent size effect on ferroelectric behavior was reflected in the polarization versus electric field hysteresis loops and domain structures. Enhancement in magnetization of the thin BiFeO3 films resulted from the strain-induced canting antiferromagnetic structure, and remarkable anisotropy was observed in the 40 nm BiFeO3 film as well due to the magnetoelastic effect induced by strain. With the increase in the film thickness, the magnetic moment of BiFeO3 films decreased back to the ordinary canted antiferromagnetic state.
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