Thickness dependence of the kondo effect in aufe films

Abstract

We have studied the Kondo effect in thin films of AuFe, through measurements of the temperature dependence of the resistivity, Δϱ( T). We find that Δϱ∼- Blog( T), as expected for the Kondo effect. We also find that the coefficient B decreases as the film thickness is reduced. This result is discussed in terms of the effect of the film thickness on the conduction electron screening clouds which surround the magnetic impurities.