Abstract
The temperature dependence of resistivity was measured for (001), (100) and (110)-oriented La1.85Sr0.15Cu4 (LSCO) thin films with thickness between 1 and 90nm on LaSrAlO4 (LSAO) substrates. As thickness increases, superconductivity appears for (001) films at 3nm, whereas it appears for (100) and (110) films at 23nm. The difference is explained by compressive strain in the c-axis direction for (100) and (110) films caused by a smaller c-axis length in LSAO than in LSCO. It is suggested that small lengths of Cu–O bonds perpendicular to CuO2 planes degrade superconductivity in this system.
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