Abstract
The thickness dependence of the coercivity of RF-sputtered amorphous TbFeCo films prepared with the same sputtering conditions has been investigated by using Faraday rotation measurements. From the use of a special STRATA mathematical method to improve EPMA it is confirmed that the composition is thickness independent and the coercivity change is correlated to the variation of the local pinning force induced by the evolution of the morphology from fine to coarse structure by increasing the film thickness.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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