Abstract
Chromium dioxide (CrO/sub 2/) thin films of different thicknesses (110-2600 /spl Aring/) have been grown epitaxially on [100]-oriented TiO/sub 2/ substrates by the chemical vapor deposition technique. The thicker films, with a Curie temperature of 395 K, exhibit in plane magnetocrystalline anisotropy with the magnetic easy axis along the c-axis direction. At low temperatures, the easy axis is deflected from the c- toward the b-axis in the thickness range 1500-600 /spl Aring/. For even smaller thicknesses, the c-axis and the magnetic easy axis coincide again. However, at 300 K, the c-axis is always the magnetic easy axis in every film studied. Resistivity measurement in the temperature range of 4.2 to 420 K has also been performed. Temperature dependence of the resistivity is highly anisotropic between the b- and the c-axis, due to thickness induced anisotropic strain in the CrO/sub 2/ films.
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