Abstract
L1 <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0</sub> -ordered FePt films with strong perpendicular magnetic anisotropy have been successfully obtained using Ta and MgO seed layers deposited on thermally oxidized Si wafers. In this paper, we focused on examining the L1 <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0</sub> -crystalline ordering, surface roughness, and magnetic properties of the bottom FePt electrode in a perpendicular magnetic tunnel junction device. The influence of varying FePt thickness (2-18 nm) and deposition temperature (380-550°C) on the formation of L1 <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0</sub> -ordered FePt films has been studied. In order to investigate the FePt grain growth effects on the magnetic properties and the surface roughness, the morphology of L1 <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0</sub> -ordered FePt films was examined through transmission electron microscope plan-view images.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
