Abstract
A Haidinger interferometer setup was adapted for accurate measurement of thickness and refractive index dispersion in transparent films using some spectral lines of a commercial argon-ion laser. Experimental results are reported and compared with those from other available methods.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
