Abstract

Thickness and Permeability Estimation of Metallic Plates by Triple-Frequency Eddy-Current Testing With Probe Lift-Off

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Similar Papers

Paper Title
Journal
Date
Author
Wireless Temperature Sensor for Condition Monitoring of Bearings Operating Through Thick Metal Plates
Lokesh A Gupta ... Dimitrios Peroulis
IEEE Sensors Journal | VOL. 13
Lokesh A Gupta, et. al.Lokesh A Gupta ... Dimitrios Peroulis
01 Jun 2013
A Fast ECT Measurement Method for the Thickness of Metallic Plates
Marco Laracca ... Salvatore Ventre
IEEE Transactions on Instrumentation and Measurement | VOL. 71
Marco Laracca, et. al.Marco Laracca ... Salvatore Ventre
01 Jan 2021
A broadband microstrip to waveguide transition for FR4 multilayer PCBs up to 50 GHz.
Tommaso Turillo ... Carlo Buoli
-
Tommaso Turillo, et. al.Tommaso Turillo ... Carlo Buoli
01 Oct 2002
Thickness Measurement of Metal Plates Using Swept-Frequency Eddy Current Testing and Impedance Normalization
Weiying Cheng
IEEE Sensors Journal | VOL. 17
Weiying ChengWeiying Cheng
15 Jul 2017
View more papers

More From: IEEE Transactions on Instrumentation and Measurement

Paper Title
Journal
Date
Author
Hybrid Kalman Recurrent Neural Network for Vehicle Trajectory Prediction
Zhenni Li ... Hongfei Xie
IEEE Transactions on Instrumentation and Measurement | VOL. -
Zhenni Li, et. al.Zhenni Li ... Hongfei Xie
01 Jan 2024
Edge-Computing-Based Knowledge Distillation and Multitask Learning for Partial Discharge Recognition
Hongqun Li ... Wensong Wang
IEEE Transactions on Instrumentation and Measurement | VOL. 73
Hongqun Li, et. al.Hongqun Li ... Wensong Wang
01 Jan 2024
Estimation of the FR4 Microwave Dielectric Properties at Cryogenic Temperature for Quantum-Chip-Interface PCBs Design
Claudio Puglia ... Giacomo Trupiano
IEEE Transactions on Instrumentation and Measurement | VOL. 73
Claudio Puglia, et. al.Claudio Puglia ... Giacomo Trupiano
01 Jan 2024
Discriminant Analysis-Guided Alignment Network for Multimachine Fault Collaborative Learning and Diagnosis
Jiaming Zhang ... Haifeng Zhang
IEEE Transactions on Instrumentation and Measurement | VOL. 73
Jiaming Zhang, et. al.Jiaming Zhang ... Haifeng Zhang
01 Jan 2024
View more papers