Abstract
Gd2O2S phosphor screens between 250 and 1000 mg/cm2 thick were evaluated for use in megavoltage imaging systems. The phosphor layers were placed on brass plates ranging from 1 to 5 mm thick, each with and without an optical back reflector (white paint). Light output and spatial resolution were measured at 6- and 23-MV x-ray energies. Light output was found to increase linearly with phosphor thickness up to 500 mg/cm2, reaching a plateau at 1000 mg/cm2. Spatial resolution [modulation transfer function (MTF)] decreased exponentially with phosphor thickness up to 750 mg/cm2, where a minimum was reached. The variation of MTF with phosphor thickness was found to obey a simple empirical relation.
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