Abstract

The deposition and characterization of thick M-type barium hexaferrite (BaFe12O19) films produced by a modified liquid phase epitaxy deposition technique are reported. The films are deposited on (111) oriented single crystal garnet (Gd3Ga5O12) substrates. The thickness of the films ranged between 45 and 80μm with growth rates of up to 40μm∕h. This growth rate is about five times greater than films grown on substrates of (111) magnesium oxide. Although the films are relatively thick, the ferrimagnetic resonance linewidth is remarkably narrow (∼50Oe) for external fields applied along the c axis.

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