Abstract
Thermoreflectance spectra of radio-frequency sputtered epitaxial single-crystal films of ${\mathrm{Pb}}_{0.83}$${\mathrm{Sn}}_{0.17}$Te from 1.5 to 6.0 eV, at room temperature and 100 K, have been measured and studied. $\ensuremath{\Delta}{\ensuremath{\epsilon}}_{1}$ and $\ensuremath{\Delta}{\ensuremath{\epsilon}}_{2}$ have been obtained through a Kramers-Kronig analysis of the experimental room-temperature $\frac{\ensuremath{\Delta}R}{R}$ spectra. A line-shape analysis of the ${E}_{2}$ structure has been performed in conjunction with an exact derivative procedure of the interband dielectric function at Van Hove singularities. Temperature coefficients have been measured and reported.
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