Abstract
High resolution surface temperature maps of a slotted surface grating laser operating at approx. 1550 nm are obtained by means of CCD-thermoreflectance imaging. The resolution is such that the temperature of the 2 µm wide ridge can be determined. Experimental temperature profiles along the ridge and in the lateral direction are provided. A 2D numerical model is developed to simulate the steady state thermal distributions in the laser. There is good agreement between the experiment and simulation. This technique allows for high-resolution imaging and will be useful where hot spots occur on laser devices.
Highlights
SEMICONDUCTOR lasers play an important role in a diverse range of applications including optical communications, gas sensing, and light detection and ranging (LIDAR), and are subject to stringent performance requirements
Thermal modelling is an important step in device design, and numerous models have led to detailed analysis of temperature distributions in simulated devices. [1]– [3] High resolution experimental investigation of thermal effects in semiconductor lasers have been done with a number of techniques including IR-SNOM [4], [5]and CCD thermoreflectance imaging (CCD-TR)
In this work we use CCD-TR imaging to image the surface temperature of a single frequency single-mode slotted semiconductor laser operating at approximately 1550 nm
Summary
SEMICONDUCTOR lasers play an important role in a diverse range of applications including optical communications, gas sensing, and light detection and ranging (LIDAR), and are subject to stringent performance requirements. The temperature distributions present in the laser during operation are of great interest to device designers as large temperature excursions and hot spots can lead to poor device performance and reduced lifespan. [1]– [3] High resolution experimental investigation of thermal effects in semiconductor lasers have been done with a number of techniques including IR-SNOM [4], [5]and CCD thermoreflectance imaging (CCD-TR). CCD-TR is a wellestablished technique to measure the surface temperature of electronic and optoelectronic devices and has been used for the thermal characterization of high power lasers [6], VCSELs [6]– [9], quantum dot lasers and quantum cascade lasers (QCLs) [10]–[12]. In this work we use CCD-TR imaging to image the surface temperature of a single frequency single-mode slotted semiconductor laser operating at approximately 1550 nm. The resolution of the imaging system is such that the temperature of the 2 μm wide laser ridge can be determined
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