Abstract
The knowledge of material physical properties is essential for a proper design of micro-electronic or micro-photonic devices. In this work, the thermo-optic effect, namely the refractive index dependence on temperature, was analized for 4H silicon carbide (4H-SiC) at the wavelength of interest for fiber-optic communication systems, $A$ = 1.55 µm, by using a simple direct technique based on the multiple beam interference in a Fabry-Perot cavity. Measurements of refractive index and extinction coefficient were carried out in a wide wavelength range by spectroscopic ellipsometry.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
