Thermomagnetic Properties of Thin Metallic Films

Abstract

The calculation of Sondheimer on the galvanomagnetic effects in thin metallic films is extended so as to permit the evaluation of the Nernst, Ettinghausen, and Leduc-Righi coefficients (${A}_{N}, {A}_{E}, {A}_{L}$). It is assumed that the conduction electrons are quasi-free and that a relaxation time exists. General expressions are derived for ${A}_{N}$, ${A}_{E}$, and ${A}_{L}$ and the asymptotic forms are given in the limit of the ratio of film thickness to mean free path much less than unity. As this ratio approaches zero, ${A}_{N}$ and ${A}_{L}$ vanish whereas ${A}_{E}$ becomes infinite.