Abstract
This work investigates the thermoluminescent (TL) glow in 1% ZnO-doped and undoped ZrO2 samples induced by 2.5–9 keV x-ray irradiation. The low-temperature TL peak at 98 °C is the main TL peak, having an intensity approximately 30 times higher than that of the high-temperature TL peak for doped and undoped samples. The high-temperature TL peak appearing at 200 °C for undoped ZrO2 samples shifts to 220 °C for the 1% ZnO-doped ZrO2 samples with higher intensities. In addition, the ratio of low-temperature to high-temperature TL peaks, R, decreases with respect to the energy of irradiated photons for the doped ZrO2 samples. However, R only slightly changes with the energy of irradiated photons for the undoped ZrO2 samples. The TL intensity of ZrO2 effectively responds to the photon energy between 2.5 and 9 keV linearly, and increases with respect to photon energy for ZnO-doped and undoped ZrO2 samples. The experimental results demonstrate that the impurity of 1% ZnO in ZrO2 can increase the intensity of both TL peaks at 98 and 220 °C. Furthermore, a simple phenomenological model is used to elucidate the mechanism of TL in this soft x-ray range.
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