Abstract
We have grown transition metal (Fe, Co, Ni, Pd) sulphide thin films and we have measured the electrical and transport properties during the formation of the films. Film structure was identified by XRD measurements. The thermoelectric power factor (S/sup 2//spl sigma/) was determined and compared with that of known thermoelectric materials. We have also performed preliminary measurements on these thin films in order to determine the thermoelectric figure of merit (ZT). ZT values of FeS/sub 2/ thin films were estimated at different temperatures and compared with those of natural single crystals. Their values were found to be low, but it is expected to get higher ZT values by controlling the film deposition parameters and doping them.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
