Abstract
We analyze thermally stimulated luminescence (TSL) above room temperature in Ce-doped Y2SiO5 oxyorthosilicate single crystal. We perform detailed TSL glow peak analysis based on the initial rise technique to evaluate trap depths and other characteristics associated with TSL peaks. The tunneling process previously proposed to be at work in recombination mechanism of Ce-doped lutetium oxyothosilicate was not confirmed in presently studied isostructural yttrium silicate. The charge carrier transfer between traps and Ce recombination centers is rather accomplished via conduction band.
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