Abstract
Thermally-stimulated-discharge current (TSDC) of corona-charged Tefzel has been studied. The activation energy of the trapping carriers was observed to increase with increasing charging voltage. The activation energy for the positively charged Tefzel was observed to be greater than that for the negatively charged samples. The behavior of the TSDC thermogram was found to be dependent on the annealing time. It is suggested that there occurs a change in the trapped carrier location from the shallower into the deeper traps during the annealing process.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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