Abstract
We report a new variation of the conventional Z-scan method to characterize the third-order optical nonlinearity of photonic materials. By exploiting the combination of the eclipse Z-scan with a thermal nonlinearity management technique, we demonstrate an improvement in sensitivity and flexibility of the method to simultaneously characterize the thermal and nonthermal nonlinearity of optical materials. The method is demonstrated by measuring the nonlinear refractive index in CS(2), SiO(2) and H(2)O, standard materials, and also in a biomaterial, the amino acid Tryptophan in water solution, using a femtosecond Ti-Sapphire laser operating at 76MHz repetition rate.
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