Abstract
In soft magnetic thin film elements thermal fluctuations may drive the system over energy barriers in time spans equivalent to the measuring time. In order to address this effect in micromagnetic simulations, a method that combines standard Landau-Lifshitz-Gilbert (LLG) micromagnetics and an elastic band method is proposed. The critical fields for vortex nucleation and the non-zero temperature hysteresis curve can be accurately predicted by this novel technique.
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