Abstract
Lead phthalocyanine films have been deposited at room temperature on to silicon substrates and than annealed in high vacuum at different temperatures. The samples have been analysed by X-ray diffraction (XRD) as well as atomic force microscopy (AFM) in order to get structural and morphological information on the samples. The as deposited film shows a monoclinic structure with a (320) orientation. Increasing the annealing temperature up to 170°C, crystallites with both triclinic and monoclinic phases are observed, although the triclinic phase seems unstable. Annealing the sample at 190°C the film consists mainly of monoclinic phase. The AFM topographic images suggest that at this temperature the triclinic crystallites evaporate, leaving wide holes in the films.
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