Abstract
Abstract The ZincPhthalocyanine (ZnPc) thin films were obtained by thermal evaporation method. The X-ray diffraction analysis of vacuum evaporated ZnPc films reveals that the structure of the film is polycrystalline in nature for the samples grown at higher substrate temperatures. The crystallite size ( D ), dislocation density ( δ ) and strain ( e ) were calculated. The optical band gap energy has been calculated from the ( αh ν) 2 vs. h ν plot. The optical band gap energy of the ZnPc films was found to decrease with increase in film thickness.
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