Thermally assisted nanosampling and analysis using micro-IR spectroscopy and other analytical methods

Abstract

Micro-thermal analysis is a technique in which the probe in a scanning probe microscope is equipped with an ultra-miniature electrical resistor that serves both as a source of heat and a means of measuring temperature. Thermal properties can be imaged and local thermal analysis can be performed by placing the tip on a selected point and linearly ramping its temperature. When a material is softened in this way, the tip often becomes contaminated with the sample. The tip can easily be cleaned by heating it to a temperature high enough to cause the contaminant to decompose. However, prior to this, the contaminant can be analysed by, amongst other techniques, photothermal IR spectroscopy.