Abstract
In this paper, we present research on thermal transition temperature determination in poly (3-hexylthiophene-2,5-diyl) (P3HT), [6,6]-phenyl-C61-butyric acid methyl ester (PC60BM), and their blends, which are materials that are conventionally used in organic optoelectronics. Here, for the first time the results of electrical resistance measurements are explored to detect thermal transitions temperatures, such as glass transition Tg and cold crystallization Tcc of the film. To confirm these results, the variable-temperature spectroscopic ellipsometry studies of the same samples were performed. The thermal transitions temperatures obtained with electrical measurements are well suited to phase diagram, constructed on the basis of ellipsometry in our previous work. The data presented here prove that electrical resistance measurements alone are sufficient for qualitative thermal analysis, which lead to the identification of characteristic temperatures in P3HT:PC60BM films. Based on the carried studies, it can be expected that the determination of thermal transition temperatures by means of electrical resistance measurements will also apply to other semi-conducting polymer films.
Highlights
Organic photovoltaic devices (OPV), such as organic solar cells, are important examples of practical applications of organic optoelectronic materials
We show that electrical resistance measurements that are dependent on temperature, like variable–temperature spectroscopic ellipsometry, are very useful for qualitative thermal analysis, helping to identify characteristic temperatures in films of P3HT:PC60BM blends
The paper presents the results of research on the thermal behavior of P3HT, PC60BM films, and their blends
Summary
Organic photovoltaic devices (OPV), such as organic solar cells, are important examples of practical applications of organic optoelectronic materials. Mei and Chung [65] showed that electrical resistance can be useful for studying thermal properties and thermal history of carbon fiber reinforced nylon-6 composite They observed the influence of heat treatment on thermal transitions (Tg and Tm ) of the materials. For the first time, the possibility of determining the characteristic thermal transition temperatures in nanometric polymer films using temperature-dependent electrical resistance measurements was investigated. We show that electrical resistance measurements that are dependent on temperature, like variable–temperature spectroscopic ellipsometry, are very useful for qualitative thermal analysis, helping to identify characteristic temperatures in films of P3HT:PC60BM blends. These studies are an introduction to the application of this method to other polymer films
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