Abstract
Thermal cycling of an epoxy coating on silicon through the glass transition temperature (T g) revealed a large stress hysteresis on the first thermal cycle through T g and a change in the stress–temperature slope at T g resulting from the change in the epoxy elastic properties due to the glass transition. This stress hysteresis was not observed on subsequent thermal cycles through T g. However, after the coating was annealed (aged) below T g (for hours or longer)—during which the stress relaxed exponentially with time—the stress hysteresis returned. The magnitude of stress hysteresis, on cycling through T g, was found to correlate to the magnitude of long-time relaxation that occurred during annealing at temperatures below T g.
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