Thermal stability of surface freezing films in Ga-based alloys: An x-ray photoelectron spectroscopy and scanning tunneling microscopy study

Abstract

We have investigated the thickness and surface structure of surface freezing films in Ga-Bi and Ga-Pb alloys over a wide temperature range between room temperature and the respective surface freezing transitions by x-ray photoelectron spectroscopy (XPS) and scanning tunnelling microscopy (STM). For the example of a Ga-Bi alloy dilute in Bi, XPS measurements show that the surface freezing film has a nearly constant value of approximately 25 A between the surface freezing temperature of 130 degrees C and room temperature if the sample is cooled slowly (5 Kh). On heating to 130 degrees C the film thickness exhibits a clear hysteresis on melting. On quenching the alloy sample (>100 Kh) the film thickness increases by almost a factor of 10. These observations indicate that the surface freezing films are metastable. The surface structure of the surface freezing films of various Ga-rich Ga-Bi and Ga-Pb alloys has been probed for the first time by STM at different temperatures below and above the bulk eutectic point. Atomically resolved STM images show the surface structures of pure Bi (0001) and Pb (111), respectively, at room temperature. On heating above the eutectic temperature the surface structure of the films does not change significantly as judged from the size and thickness of Pb or Bi terraces. These observations together with the film thickness variation with temperature indicate that the surface freezing films behave like a metastable independent surface phase. These results together with the wetting characteristics of these alloys suggest that surface freezing in these systems is a first order surface phase transition between wetting and metastable surface freezing films. The energy barrier for nucleation is strongly reduced due to a lowering of the interfacial energy if the nucleus is completely immersed in the respective wetting layer.