Thermal resistance from non-equilibrium phonons at Si–Ge interface

Abstract

As nanostructured devices become prevalent, interfaces often play an important role in thermal transport phenomena. However, interfacial thermal transport remains poorly understood due to complex physics across a wide range of length scales from atomistic to microscale. Past studies on interfacial thermal resistance have focused on interface-phonon scattering at the atomistic scale but overlooked the complex interplay of phonon-interface and phonon-phonon scattering at microscale. Here, we use the Peierls-Boltzmann transport equation to show that the resistance from the phonon-phonon scattering of non-equilibrium phonons near a Si–Ge interface is much larger than that directly caused by the interface scattering. We report that non-equilibrium in phonon distribution leads to significant entropy generation and thermal resistance upon three-phonon scattering by the Boltzmann's H-theorem. The physical origin of non-equilibrium phonons in Ge is explained with the mismatches of phonon dispersion, density-of-states, and group velocity, which serve as general guidance for estimating the non-equilibrium effect on interfacial thermal resistance. Our study bridges a gap between atomistic scale and less studied microscale phenomena, providing comprehensive understanding of overall interfacial thermal transport and the significant role of phonon-phonon scattering.