Abstract
ABSTRACTThermal post-buckling analysis is first presented for functionally graded elliptical plates based on high-order shear deformation theory in different thermal environments. Material properties are assumed to be temperature-dependent and graded in the thickness direction. Ritz method is employed to determine the central deflection-temperature curves, the validity of which can be confirmed by comparison with related researchers' results; it is worth noting that the forms of approximate solutions are well chosen in consideration of both simplicity and accuracy. Influences played by different supported boundaries, thermal environmental conditions, ratio of major to minor axis, and volume fraction index are discussed in detail.
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