Abstract
A method of accurately estimating the I/sub 0/ (critical current) of a Josephson junction (JJ) with thermal noise was developed by measuring the effective thermal noise temperature of a JJ. The effective thermal noise temperature of various JJ devices was measured and calculated. The JJ devices evaluated included inductively and resistively coupled logic devices and JJ devices in the presence of various noise sources. The noise sources included room-temperature resistors, switched JJ devices, and JJ devices in the linear I-V region beyond the gap. The R/sub NN/ compensator is shown to result in a noise temperature of about 6 K at an interferometer. The addition of a shunt junction lessens the noise penalty introduced by the compensator. A switched isolation interferometer in a two-input AND gate contributes negligible noise at the injection device. It is also shown that bandwidth connections to room-temperature equipment result in very large excess noise and require special input and output circuits on the chip.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
