Abstract

In this paper, we examine thermal noise and radiation-pressure effects in MEMS tunable Fabry-Perot etalons. We show that thermal noise causes a jitter in the center wavelength in very high finesse etalons. In turn, the jitter causes an effective increase in the time-averaged filter bandwidth. Radiation pressure is of little consequence in conventional Fabry-Perot etalons, but it can give rise to nonlinearities and hysteresis in the tuning response of high-finesse MEMS filters. We develop models of noise and optical nonlinearities and compare the models with a series of measurements on commercial tunable high-finesse MEMS Fabry-Perot etalons.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.