Abstract
Thermal stability of the edge region of reversed-field pinch configurations is analyzed within the context of a two-fluid model. Two major sources of instability are identified in combination with a parallel electric field: either an electron temperature gradient and/or a density gradient that leads to rapid growth (of several to many ohmic heating rates) over a region of several millimeters around the mode-rational surfaces in the edge region. The basic signature of both instabilities is electrostatic. In the case of the density gradient mode, the signature relies on the effects of electron compressibility, whereas the temperature gradient mode can be identified as the current-convective instability by taking the limit of zero diamagnetic drift, density gradient, thermal force, drift heat flux, and electron compressibility.
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