Abstract
Thermal dependent changes of light depolarization degree were observed in the SnO2:In2O3 (ITO) layers deposited onto the flat glass substrates which are used usually as electrodes for optoelectronic devices. The observed effect is reversible. It can be attributed to the changes of nanostructure geometry in the bulk of the ITO layer as well as on its surface. Such geometric changes involve dispersion of polarized light. The investigated effect should be taken into consideration when developing optoelectronic devices because it can provoke distortion of the optical information field.
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