Thermal hysteresis behaviors of thermoelectric properties

Abstract

Thermoelectric behaviors for the thermal cycles between room and high temperatures are investigated in (Bi,Sb)2Te3 and Bi2S3. Because the reliability and reproducibility of the data against repeated heating are required, the Harman method is adopted to evaluate the figure of merit, ZT, in which only electrical contacts are needed. The electrical contacts are made by the spot welding method using a simple and low-power machine made in our laboratory to avoid damage to the samples. Thermoelectric properties are changed by repeating thermal cycles, though their rate of change is not always very high and is material dependent. The carrier number dominantly contributes to the thermal hysteresis of the thermoelectric properties upon the repetition of the thermal cycles, which actually affects the sample as an annealing effect. It is pointed out that changes in thermoelectric properties upon the repetition of the thermal cycles should be examined beforehand in practical applications.