Abstract
The linear thermal expansion of niobium has been measured in the temperature range 1500–2700 K by means of a transient (subsecond) interferometric technique. The basic method involves rapidly heating the specimen from room temperature up to and through the temperature range of interest in less than 1 s by passing an electrical current pulse through it and simultaneously measuring the specimen temperature by means of a high-speed photoelectric pyrometer and the shift in the fringe pattern produced by a Michelson-type interferometer. The linear thermal expansion is determined from the cumulative shift corresponding to each measured temperature. The results for niobium may be expressed by the relation (l-l0)/l0=5.4424×10−3−8.8553×10−6T+1.2993×10−8T2 −4.4002×10−12T3+6.3476×10−16T4 where T is in K and l0 is the specimen length at 20°C. The maximum error in the reported values of thermal expansion is estimated to be about 1% at 2000 K and not more than 2% at 2700 K.
Published Version
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