Abstract
Low energy ions were injected into sintered UO 2 and the probabilities of entrapment measured, as a function of ion energy from 50 eV to 3 keV, by heating the targets after irradiation and recording the ratio of quantity of gas released to incident ion fluence. Values of entrapment probability increase from zero at low ion energies to about unity at 1 keV. The rate of thermal gas evolution was also recorded as a function of temperature during the post-bombardment target tempering, enabling deduction of activation energies for evolution. These activation energies are correlated with published data on the annealing of point and extended defects in the solid and with self diffusion energies.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
