Abstract
Photothermal beam deflection technique has been employed for the measurement of thermal diffusivity of different compositions of semiconducting amorphous GexSe100−x thin films. Slope from the tangential component of the deflection signal with the pump-probe offset is used to evaluate the numerical value of thermal diffusivity (α). The mirage signal is analysed using the phase method and the result of the measurement is verified using the amplitude method. The experiments are carried out using carbon tetrachloride as the coupling medium for two different modulation frequencies, both of which have yielded the same value of thermal diffusivity. The variation in thermal diffusivity of the samples with composition is also investigated and is explained on the basis of structural changes taking place in the glass network.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
