Abstract

The effect of exposure to elevated temperatures on dielectric and piezoelectric properties near the morphotropic phase boundary is examined, and the mechanisms of thermal degradation involved as compared to normal ferroelectric materials are discussed. The thermal degradation of dielectric and piezoelectric properties was investigated for relaxor ferroelectric compositions in the (1-x)Pb(Mg/sub 1/3/Nb/sub 2/3/)O/sub 3/-(x)PbTiO/sub 3/ family near the morphotropic phase boundary. Degradations of the radial coupling factor piezoelectric charge coefficient and mechanical quality factor were observed to be less than expected based on the temperature dependence of the polarization. >

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.