Abstract
The in-plane thermal conductivity of thin polycrystalline diamond films produced in a d.c. discharge system has been measured by a contactless technique of transient thermal grating. Diamond films of different qualities but of the same thickness (11 μm) were deposited from CH 4/H 2 mixtures at methane contents ranging from 2% to 10%. The highest thermal conductivity k = 9.5 W cm −1 K −1 was found for the sample synthesized at the lowest CH 4 concentration (2%), the value of k smoothly decreasing to 1.2 W cm −1 K −1 with increasing methane content. The obtained results are in good agreement with previous measurements on similar films performed by the mirage technique. A correlation of thermal conductivity with film morphology and phase content analyzed by SEM and Raman spectroscopy is discussed.
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