Abstract

We recently developed Flash DSC application to characterize the cross-plane thermal conductivity of polyethylene thin films (Thermochimica Acta 2019, 677, 21–25). We hereby applied this method to measure the thermal conductivities of Nylon 46, Nylon 66 and Nylon 610 after their complete crystallization at 156.6 °C, i.e. the temperature around the melting points of Indium particles. The melting point differences of two Indium particles separately placed on the top of the Nylon samples and on the reference cell exhibit a linear dependence of the heating rates, demonstrating the Fourier’s heat conduction law. From the slope, we further derived the thermal conductivity after we measured the specific heat capacity via conventional DSC and measured the sample thickness via the laser confocal fluorescence microscope. The obtained thermal conductivities of three Nylon samples increase with their hydrogen-bonding densities, which are consistent with conventional experimental approaches. The observations validated the general application of our method for the measurement of thermal conductivity of bulk materials.

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