Abstract

In this work, a thermal characterization (measurement of dynamic thermal parameters) of quaternary Zn1−x−yBexMnySe mixed crystals was carried out. The crystals under investigation were grown from the melt by the modified high-pressure Bridgman method with different Be and Mn contents. The effect of Be and Mn contents on thermal properties of Zn1−x−yBexMnySe compounds was analyzed, by using the photopyroelectric (PPE) method in the back configuration (BPPE) for thermal diffusivity measurements and the PPE technique in the front configuration for thermal effusivity investigations. Infrared lock-in thermography was used in order to validate the BPPE results. The measured thermal effusivity and diffusivity allowed the calculation of thermal conductivity of the investigated materials.

Highlights

  • Diluted magnetic semiconductors (DMS) are materials with magnetic ions like Mn2? implemented into the crystal structure [1]

  • In order to validate the results obtained by PPE calorimetry, lock-in thermography technique is used for determining the thermal diffusivity of the crystals

  • A complete thermal characterization of Zn1-x-yBexMnySe crystals grown by high-pressure modified Bridgman–Stockbarger method was carried out

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Summary

Introduction

Diluted magnetic semiconductors (DMS) are materials with magnetic ions like Mn2? implemented into the crystal structure [1]. DMS based on II–VI crystals such as Zn1-x-yBexMnySe mixed compounds with the manganese are very promising materials due to their unique magnetic and optical properties [2] with potential application in the. The thermal diffusivity of the investigated materials is obtained with PPE technique [13,14,15] in the back detection configuration, coupled with the chopping frequency of the incident radiation scanning procedure. In order to validate the results obtained by PPE calorimetry, lock-in thermography technique is used for determining the thermal diffusivity of the crystals. The PPE method in the front detection configuration, together with the thickness scanning procedure (TWRC), is applied in order to obtain the crystals’ thermal effusivity. The thermal conductivity dependence of the investigated materials on their composition is analyzed

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