Abstract
In narrow YBa2Cu3O7 films, we have measured the delay timebetween the excitation by a critical current pulse and the voltage response,and analysed it on the basis of a time-dependent Ginzburg-Landau equation toprovide the gap relaxation time. In the present experimentalsituation, thisparameter can be identified with the phonon escape time, and so it providesinformation on the film-to-substrate thermal resistance. Our results forvarious conditions of thickness and of temperature are consistent with otherindependent data found either in our laboratory or reported in the literature.This new procedure is fast and applicable at any temperature belowTc.
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