Abstract
Atomic layer etching (ALE) of Al2O3, HfO2, and ZrO2 was accomplished using sequential exposures with hydrogen fluoride (HF) as the fluorination reagent and dimethylaluminum chloride (DMAC, AlCl(CH3...
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
