Abstract
Ag–TiO2 nanocomposite thin films on silica glass were prepared through thermal evaporation in combination with RF magnetron sputtering. Thermal annealing induced changes in the optical, morphological and structural properties of Ag–TiO2 nanocomposites were examined using optical absorption, photoluminescence spectroscopy, Raman spectroscopy, FESEM, AFM and XRD. FESEM and AFM studies revealed cave in of the Ag–TiO2 thin film at various places leading to the formation nanoscale pits upon thermal annealing at 600 °C. The computed average size of pits was found to be 54 nm. Raman studies indicated 600 °C annealing induced transformation of anatase phase of TiO2 into anatase/rutile mixed phase TiO2. Optical absorption spectra showed systematic changes due to the effects of mixed phase formation and variation in the plasmonic behavior upon annealing. PL results of the as deposited Ag–TiO2 thin film showed peaks at 377, 402, 432 and 486 nm. PL studies of Ag–TiO2 nanocomposites treated at different annealing temperatures revealed changes in defect concentration in TiO2. The tentative mechanism for the creation of nanoscale pits in Ag–TiO2 thin film through thermal annealing was proposed.
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