Thermal and optical characterization of a resistance-temperature detector based on platinum thin film: Design and fabrication

Abstract

In this research, it is presented an easy-to-implement method, utilizing spin coating-sputtering technique, for the production of cost-effective resistance temperature detectors (RTDs) based on platinum (Pt). By employing physical patterning mask techniques such as lithography, the shape of RTDs can be readily customized to meet specific requirements. Furthermore, the developed Pt-based RTDs exhibit a higher sensitivity, with a temperature coefficient of resistance (α) approximately at 3.87 × 10−3 ◦C−1, compared to RTDs based on Au, Ag, and Cu. The sensitivity of these Pt-based RTDs is comparable to that of commercially available Pt-based sensors. Moreover, these RTDs demonstrate exceptional repeatability, maintaining consistent performance within a temperature range of up to 200 ◦C. According to interesting nonlinear optical findings, Pt-based RTD sensor showed the nonlinear optical responses in the 532 nm wavelength because of two photon absorption phenomena in nonlinear absorption coefficient (NLA) and self-focusing effect in addition to their excellent temperature sensing capabilities, the Pt-based RTDs exhibit notable nonlinear optical refractive index (NLR) and nonlinear absorption (NLA) properties. The NLR index of the RTDs is on the order of 10−8 cm2/W, while the NLA index is on the order of 10−3 cm/W. This implies that these RTDs possess significant nonlinear optical response characteristics. Moreover, the Pt-based RTDs demonstrate rapid response times to changes in temperature, making them suitable for applications in nonlinear optical equipment such as optoelectronics and photonics.