Abstract
Thermal stability of the circuit boards with a quad flat package (QFP) soldered with Sn-58wt%Bi-(0, 0.5 and 1.0) wt% Ag and their microstructural features were evaluated. The addition of 1.0 wt% Ag causes the formation of large primary Ag/sub 3/Sn precipitates in the solder while no primary Ag/sub 3/Sn is found in Sn-57Bi-0.5Ag. Thermo-Calc calculation indicates that the lowest limit content for the formation of primary Ag/sub 3/Sn is about 0.8 wt%. Heat-exposure below 100/spl deg/C has no serious degradation on the joint structure for all solders. Heat-exposure at 125/spl deg/C caused serious degradation in joint strength for all alloys. The contamination of Pb from Sn-Pb surface plating on the components reduces the interface tolerance by forming ternary Sn-Pb-Bi phase melting at low temperature. Thermal fatigue between -20 and 80/spl deg/C does not have any significant influence on joint structure.
Published Version
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