Abstract
A new thermal analysis of a catastrophic mirror damage in laser diodes is presented in the present paper. Three-dimensional heat spreading and temperature dependence of a thermal conductivity is taken into account in the model. Both an active layer heating and a nonradiative recombination of carriers generated by absorbed radiation in an active area close to a facet mirror are considered as heat sources. The model is strictly correct for times ranging from 6.2 to 500 nsec for a standard stripe laser diode, i.e., for currents not higher than 4.5 A and not lower than 0.8 A. The analytical solution of the thermal conduction equation gives a dependence of a catastrophic-degradation time, i.e., a permissible length of current pulses from a point of view of the catastrophic mirror damage, on the amplitude of the pulses for the standard stripe laser diode.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
