Abstract
This paper proposes analytics for reliability assessment of non-isolated conventional pulse width modulation DC-DC (NIDC-DC) converters. This class of converters consists of conventional Buck, Boost, Buck–Boost, Cuk, Sepic and Zeta topologies. The proposed analytics are founded based on the Markov process principles and can effectively capture the effects of duty cycle, input voltage, output power, voltage gain, components characteristics and aging on the overall reliability performance and mean time to failure of the NIDC-DC converters. Furthermore, the suggested framework takes both continuous and discontinuous conduction modes of each converter into account, with which the open and short circuit faults in the components are analysed. As an important outcome, the most reliable operation region of the NIDC-DC converters are obtained with respect to different operational parameters, which is useful in design procedure. Eventually, extensive thermal experiments with an appropriate reflection of reliability metric are conducted to measure the components’ temperatures and verify their performance in different operating conditions.
Highlights
With the rapid advancement and wide deployment of power electronic infrastructure in the electric industry, comprehensive analysis of power electronic converters from different aspects has attracted significant research and development [1,2,3]
This paper proposes analytics for reliability assessment of non-isolated conventional pulse width modulation DC-DC (NIDC-DC) converters
Complementary to the proposed reliability analytics and failure rate analysis of different classes of NIDC-DC converters, this section is devoted to mean time to failure (MTTF) evaluations as discussed earlier in Equation (6)
Summary
With the rapid advancement and wide deployment of power electronic infrastructure in the electric industry, comprehensive analysis of power electronic converters from different aspects has attracted significant research and development [1,2,3]. While centred on conventional Boost converter in a closed-loop control operation, the analyses in [10] are generic enough to be applied to other types of power converters It has been demonstrated in [10] that (i) an increase in the modelled series resistance of the main switch or in the output capacitor would result in a degradation of the converter’s overall reliability performance, and (ii) the variation in the converter’s capacitor reveals a complicated, and at times hard to characterize, impacts on the converter’s reliability. In [16], reliability analysis is presented on single stage and interleaved conventional Boost converters, where Markov models are employed in the latter to investigate the reliability performance in two distinct scenarios of half and full nominal power operation modes for one stage following a failure in the other.
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